Thermofinnigan/Digital: Scanning Atomic Force Microscope. Topological survey of molecules with nM resolution
Location: NSC 447
Contact: Level III Hui Zhao ; 404-413-5379
Application: The atomic force microscope is a scanning-proximity probe microscope, which does not use lenses, rather it works by measuring a local property -height, optical absorption, or magnetism- using a probe or "tip" positioned proximal to the sample. To acquire an image the microscope raster-scans the probe over the sample while measuring the local perturbations in the property in question (resolution is in the nm range). Some important features of AFM include:• Scanned-proximity probe microscopes provide very high resolution images of various sample properties
• The atomic force microscope measures topography with a force probe
• Laser beam deflection offers a convenient and sensitive method of measuring cantilever deflection
• Micromachining techniques produce inexpensive, reasonably sharp tips
Form and charges: AFM Website: Thermoginnigan General information